Smoltek's CNF-MIM Capacitors Set New Performance Benchmarks
Smoltek unveils groundbreaking advancements in CNF-MIM capacitor technology with exceptional thermal and voltage stability.

Sammanfattning
Smoltek's latest CNF-MIM capacitors demonstrate superior thermal and voltage stability, surpassing current ultra-thin MLCCs. This innovation could revolutionize high-end processor applications.
In a recent announcement, Smoltek has revealed a significant breakthrough in their CNF-MIM capacitor technology, as stated by Dr. Farzan Ghavanini, CTO of Smoltek. The new capacitors, integrating CNF electrodes with a ZrO₂/Al₂O₃ stack, not only utilize DRAM-grade dielectrics but also exhibit outstanding TCC and VCC characteristics. These features outperform the ultra-thin MLCCs currently used in high-end processors, marking a leap forward in capacitor technology.
The capacitors demonstrated robust thermal stability (TCC), maintaining performance up to 125°C with only a ~2.5% change in capacitance from room temperature. This highlights their durability under extended thermal stress. Additionally, the voltage stability (VCC) was impressive, with only a ~3% change in capacitance across a bipolar voltage range of ±4V, and just ~1% shift at a 2V operating range, making them ideal for high-performance systems.
The advanced dielectric stack, composed of zirconium oxide and aluminum oxide, is the same used in the most advanced DRAM technologies. This commonality underscores the reliability and potential integration of Smoltek's capacitors in existing systems. The next phase involves extensive accelerated life testing to ensure long-term reliability under operating conditions.
Given these promising developments, investors might consider holding their positions in Smoltek. The company's commitment to innovation and the potential applications of their capacitors in high-end processors could lead to substantial growth opportunities.
Källa
Sammanfattning
Smoltek's CTO, Dr. Farzan Ghavanini, announced a significant advancement in their CNF-MIM technology. The integration of CNF electrodes with a ZrO₂/Al₂O₃ dielectric stack enhances reliability and performance, surpassing current ultra-thin MLCCs used in high-end processors. The capacitors demonstrated strong thermal stability, maintaining performance up to 125°C with minimal capacitance change, and excellent voltage stability across a ±4V range with negligible capacitance shift. These features make them suitable for high-performance systems. The dielectric stack is similar to those in advanced DRAM technologies. Smoltek plans further testing to ensure long-term reliability. For more details, contact Magnus Andersson, CEO of Smoltek Nanotech Holding AB.